170847950
2013-07-23
2023-09-12T11:09:30
Machine Learning for Computer Vision, Roberto Cipolla, Sebastiano Battiato, Giovanni Maria Farinella (Eds.), cop. 2013
0000000096390891
male
Farinella, Giovanni Maria
Farinella
Giovanni Maria
Giovanni Maria Farinella
Pattern Recognition. ICPR International Workshops and Challenges : Virtual Event, January 10-15, 2021, Proceedings, Part III / edited by Alberto Del Bimbo ; Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani / Cham : Springer International Publishing
Computer Vision, Imaging and Computer Graphics Theory and Applications : 15th International Joint Conference, VISIGRAPP 2020 Valletta, Malta, February 27-29, 2020, Revised Selected Papers / edited by Kadi Bouatouch ; A. Augusto de Sousa, Manuela Chessa, Alexis Paljic, Andreas Kerren, Christophe Hurter, Giovanni Maria Farinella, Petia Radeva, Jose Braz / Cham : Springer International Publishing
Image Analysis and Processing, ICIAP 2022 Part II, : 21st International Conference, Lecce, Italy, may 23–27, 2022 : proceedings / editors, Stan Sclaroff, Cosimo Distante, Marco Leo, Giovanni M. Farinella, Federico Tombari / Cham : Springer International Publishing
Pattern Recognition. ICPR International Workshops and Challenges : Virtual Event, January 10-15, 2021, Proceedings, Part I / edited by Alberto Del Bimbo ; Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani / Cham : Springer International Publishing
Machine learning for computer vision / edited by Roberto Cipolla, Sebastiano Battiato, Giovanni Maria Farinella / 1st ed. 2013. / Berlin, Heidelberg : Springer Berlin Heidelberg
Pattern Recognition. ICPR International Workshops and Challenges : Virtual Event, January 10-15, 2021, Proceedings, Part V / edited by Alberto Del Bimbo ; Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani / Cham : Springer International Publishing
Computer Vision, Imaging and Computer Graphics Theory and Applications : 17th International Joint Conference, VISIGRAPP 2022, Virtual Event, February 6–8, 2022, Revised Selected Papers / edited by A. Augusto de Sousa ; Kurt Debattista, Alexis Paljic, Mounia Ziat, Christophe Hurter, Helen Purchase, Giovanni Maria Farinella, Petia Radeva, Kadi Bouatouch / Cham : Springer Nature Switzerland
Pattern Recognition. ICPR International Workshops and Challenges : Virtual Event, January 10-15, 2021, Proceedings, Part VIII / edited by Alberto Del Bimbo ; Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani / Cham : Springer International Publishing
Computer Vision, Imaging and Computer Graphics Theory and Applications : 16th International Joint Conference, VISIGRAPP 2021, Virtual Event, February 8-10, 2021, Revised Selected Papers / edited by A. Augusto de Sousa ; Vlastimil Havran, Alexis Paljic, Tabitha Peck, Christophe Hurter, Helen Purchase, Giovanni Maria Farinella, Petia Radeva, Kadi Bouatouch / Cham : Springer International Publishing
Image Analysis and Processing, ICIAP 2022 Part III, : 21st International Conference, Lecce, Italy, may 23–27, 2022 : proceedings / editors, Stan Sclaroff, Cosimo Distante, Marco Leo, Giovanni M. Farinella, Federico Tombari / Cham : Springer International Publishing
Pattern recognition. ICPR international workshops and challenges part IV, : virtual event, January 10-15, 2021, proceedings / edited by Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani / Cham : Springer International Publishing
Computer vision : detection, recognition and reconstruction / edited by Roberto Cipolla, Sebastiano Battiato, Giovanni Maria Farinella / 1st ed. 2010. / Berlin, Heidelberg : Springer Berlin Heidelberg
Pattern Recognition. ICPR International Workshops and Challenges : Virtual Event, January 10-15, 2021, Proceedings, Part VII / edited by Alberto Del Bimbo ; Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani / Cham : Springer International Publishing
Image Analysis and Processing, ICIAP 2022 Part I, : 21st International Conference, Lecce, Italy, may 23–27, 2022 : proceedings / editors, Stan Sclaroff, Cosimo Distante, Marco Leo, Giovanni M. Farinella, Federico Tombari / Cham : Springer International Publishing
Pattern Recognition. ICPR International Workshops and Challenges : Virtual Event, January 10-15, 2021, Proceedings, Part VI / edited by Alberto Del Bimbo ; Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani / Cham : Springer International Publishing
New Trends in Image Analysis and Processing – ICIAP 2017 : ICIAP International Workshops, WBICV, SSPandBE, 3AS, RGBD, NIVAR, IWBAAS, and MADiMa 2017, Catania, Italy, September 11-15, 2017, Revised Selected Papers / edited by Sebastiano Battiato ; Giovanni Maria Farinella, Marco Leo, Giovanni Gallo / Cham : Springer International Publishing
Pattern Recognition. ICPR International Workshops and Challenges : Virtual Event, January 10-15, 2021, Proceedings, Part II / edited by Alberto Del Bimbo ; Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani / Cham : Springer International Publishing
Machine Learning for Computer Vision / Roberto Cipolla, Sebastiano Battiato, Giovanni Maria Farinella (Eds.) / Berlin : Springer , cop. 2013